Electronic Publication/s
Selective interface toughness measurements of layered thin films
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Selective interface toughness measurements of layered thin films
Details
Subject Area
Natural Science
Quality review
refereed - online
R. Konetschnik - R. Daniel - R. Brunner - D. Kiener
Selective interface toughness measurements of layered thin films
page 1
doi:
10.1063/1.4978337
Abstract
PDF
