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  • R. Konetschnik - R. Daniel - R. Brunner - D. Kiener

Selective interface toughness measurements of layered thin films


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    Abstract

    Authors

    Details

    Release date:

    Feb, 2017,

    ISBN Online Edition

    978-3-7001-8171-2

    DOI

    doi: 10.1553/0x0036ad79

    Pages:

    6 Seiten,

    Dimension:

    Research Article